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Detection of Trace Impurities in High Purity Tungsten

Detection of Trace Impurities in High Purity Tungsten

(Summary description)Determination of trace elements in high-purity tungsten is an important criterion for evaluating the performance of high-purity tungsten.

Detection of Trace Impurities in High Purity Tungsten

(Summary description)Determination of trace elements in high-purity tungsten is an important criterion for evaluating the performance of high-purity tungsten.

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Determination of trace elements in high-purity tungsten is an important criterion for evaluating the performance of high-purity tungsten. Reducing the lower limit of trace element determination and increasing the number of trace elements to be determined, and improving the accuracy and sensitivity of measurement are the main components of the high-purity tungsten detection process. attack direction. The commonly used methods for the detection of trace elements in high-purity metals include spectral analysis, mass spectrometry, and neutron analysis. With the improvement of material purity, traditional spectral analysis and neutron analysis cannot meet the analytical requirements of 6N tungsten powder in terms of the amount of elements and analytical sensitivity. increasingly important role.

high purity tungsten manufacturers


Inductively coupled plasma mass spectrometry ( ICP-MS ) is a new generation of trace analysis technology. It has the advantages of low detection limit and simultaneous multi-element analysis. However, there is still the problem of matrix effect interference.
Beijing Institute of Nonferrous Metals adopts pre-separation and enrichment technology, separates the matrix by means of ion chromatography, reduces the interference of the matrix on the detection of impurities, and uses the membrane desolvation device to purge the solvent to effectively reduce the yield of oxides in the process of ICP-MS detection. Impurities in 6N tungsten powder were accurately determined.
 

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